IEEE Transactions on Very Large Scale Integration (VLSI) Systems

2 Ieee Transactions on Very Large Scale Integration ( Vlsi

1 Computing Lower Bounds on Functional Units Before Scheduling1 Samit Chaudhuri2, Robert A. Walker3 Abstract|This paper presents a new polynomial-time algorithm for computing lower bounds on the number of functional units (FUs) of each type required to schedule a data ow graph in a speci ed number of control steps. A formal approach is presented that is guaranteed to nd the tightest possible bo...

Transactions on Very Large Scale Integration ( Vlsi

Transactions on Very Large Scale Integration ( Vlsi

Functional yield is a term used to describe the percentage of dies on a wafer that are not affected by catastrophic defects. Within the interconnect these defects are usually caused by particle contamination and are divided into bridging defects, which join adjacent wires and cuts, which result in broken wires. Functional yield is therefore determined by the geometry of the routing channels, ho...

Multilevel Hypergraph Partitioning: Applications in VLSI Domain - Very Large Scale Integration (VLSI) Systems, IEEE Transactions on

In this paper, we present a new hypergraphpartitioning algorithm that is based on the multilevel paradigm. In the multilevel paradigm, a sequence of successively coarser hypergraphs is constructed. A bisection of the smallest hypergraph is computed and it is used to obtain a bisection of the original hypergraph by successively projecting and refining the bisection to the next level finer hyperg...

Ieee Transactions on Very Large Scale Integration Systems

We present a low-complexity framework for classifying elementary arm-movements (reach-retrieve, lift-cup-tomouth, rotate-arm) using wrist-worn, inertial sensors. We propose that this methodology could be used as a clinical tool to assess rehabilitation progress in neurodegenerative pathologies tracking occurrence of specific movements performed by patients with their paretic arm. Movements perf...